首页 | 本学科首页   官方微博 | 高级检索  
     


Oxygen impurity and microalloying effect in a Zr-based bulk metallic glass alloy
Authors:C T Liu  M F Chisholm  M K Miller
Affiliation:1. Chair of Materials Science and Engineering for Metals, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Martensstraße 5, Erlangen 91058, Germany;2. Institute for Materials, Ruhr-Universität Bochum (RUB), Bochum 44801, Germany;3. Materials Science & Engineering – Institute I, Interdisciplinary Center for Nanostructured Films, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Cauerstraße 3, Erlangen 91058, Germany;4. Institute of Photonic Technologies, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Konrad-Zuse-Straße 3/5, Erlangen 91052, Germany;1. Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, 40237 Düsseldorf, Germany;2. IFW Dresden, Institute for Complex Materials, Helmholtzstr. 20, 010 69 Dresden, Germany
Abstract:A Zr-base bulk metallic glass (BMG) alloy with the base composition Zr–10 at.%Al–5% Ti–17.9% Cu–14.6% Ni (BAM-11) was used to study the effects of oxygen impurities and microalloying on the microstructure and mechanical properties. Oxygen impurity at a level of 3000 appm dramatically reduced the glass forming ability and embrittled BAM-11 at room temperature. The embrittlement was due to the formation of oxygen-induced Zr4Ni2O nuclei that triggered near complete crystallization of the metallic glass. Microalloying with 0.1 at.%B+0.2%Si+0.1%Pb was effective in suppressing the crystalline phase formation and alleviating the detrimental effect of oxygen. Microstructural analyses indicate that the beneficial effect of the optimum dopants was mainly due to stabilization of the glass-phase matrix even though it contained high levels of oxygen. Thus, microalloying is effective in reducing the production cost and is very useful for manufacturing good-quality Zr-based BMGs from impure charge materials.
Keywords:B  Glasses  metallic  Mechanical properties at ambient temperatures  D  Phase interface  F  Atom microprobe  Electron microscopy  scanning
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号