Cartesian-structure analysis in cast films by advanced infrared multiple-angle incidence resolution spectroscopy

Multiple-angle incidence resolution spectroscopy (MAIRS) has been improved to be an advanced algorithm so that the Cartesian structure in organic thin films can be analyzed. The infrared MAIRS technique was originally proposed as a totally new spectroscopic technique to reveal structural anisotropy in thin films on an infrared-transparent substrate, which yields both in-plane- (IP; X and Y) and out-of-plane (OP; Z)-mode spectra from an identical sample. Since this technique employs an analytical concept based on a signal decomposition of light intensity (not absorbance spectra), the algorithm intrinsically has high potential for further development. In the present study, the theoretically deduced matrix that correlates the light intensity to the angle of incidence has been modified to further decompose the IP-mode spectrum into X and Y components. As a result, anisotropic measurements of infrared spectra of thin film have become possible for the X, Y, and Z directions (Cartesian coordinate) simultaneously. With this advanced algorithm, the Cartesian structural changes in a cast film prepared on a germanium substrate have readily been analyzed, and a change from the biaxial to the uniaxial film structure with aging has spectroscopically been revealed.