| 近衍射极限半导体激光束波面检测 |
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| 引用本文： | 刘宏展,刘立人,徐荣伟,栾竹,滕树云. 近衍射极限半导体激光束波面检测[J]. 中国激光, 2005, 32(4): 19-522 |
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| 作者姓名： | 刘宏展 刘立人 徐荣伟 栾竹 滕树云 |
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| 作者单位： | 1. 中国科学院上海光学精密机械研究所信息光学研究室,上海,201800;中国科学院研究生院,北京,100049
2. 中国科学院上海光学精密机械研究所信息光学研究室,上海,201800 |
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| 基金项目： | 上海市科委重点科技项目(012261011)资助项目。 |
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| 摘 要： | 在星间半导体激光通信系统中，如何检测发射光束波面的质量是个较难处理的问题，为了较好地解决这一问题，在简单介绍白光横向双剪切干涉仪的基础上，报道了用此干涉仪对近衍射极限半导体激光光束波面的检测，在此基础上推导出计算远场发散度的公式。实验测得近场光束的波高差为0．2A，通过夫朗和费衍射求得光束的发散度仅为64．8μrad，这表明光束接近光学衍射极限。同时，表明双剪切干涉仪灵敏度高、实用性好。
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| 关 键 词： | 光通信 双剪切干涉仪 发散度 衍射极限 |
| 收稿时间： | 2004-03-01 |
Measuring Near the Diffraction-Limited Wavefront of Semiconductor Laser Beam |
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| LIU Hong-zhan,LIU Li-ren,XU Rong-wei,LUAN Zhu,TENG Shu-yun. Measuring Near the Diffraction-Limited Wavefront of Semiconductor Laser Beam[J]. Chinese Journal of Lasers, 2005, 32(4): 19-522 |
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| Authors: | LIU Hong-zhan LIU Li-ren XU Rong-wei LUAN Zhu TENG Shu-yun |
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| Affiliation: | LIU Hong-zhan 1,2,LIU Li-ren1,XU Rong-wei1,LUAN Zhu1,TENG Shu-yun1 1 Information Laboratory,Shanghai Institute of Optics and Fine Mechanics,the Chinese Academy of Sciences,Shanghai 201800,China 2 Graduate School,The Chinese Academy of Sciences,Beijing 100049,China |
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| Abstract: | In the semiconductor intersatellite communication system, how to test the laser beams′ quality is difficult. In order to solve this problem, a basal principle of the white light lateral double-shearing interferometer is introduced firstly, and then measuring the semiconductor laser beam′s wavefront which is near the diffraction-limited by the interferometer is reported, and the formula of calculating the beam′s divergence is deduced according to the Fraunhofer diffraction. A 0.2λ wavefront error is gained experimentally. Corresponding to the wavefront error, the divergence angle is only 64.8 μrad, which indicates the beam is near the diffraction-limited. The result shows that the interferometer has high precision and wide practicability. |
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| Keywords: | optical communication double-shearing interferometer divergence angle diffraction-limited |
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