On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride |
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| Authors: | L. N. Lukyanova A. Yu. Bibik V. A. Aseev O. A. Usov I. V. Makarenko V. N. Petrov N. V. Nikonorov |
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| Affiliation: | 1.Ioffe Institute,Russian Academy of Sciences,St. Petersburg,Russia;2.St. Petersburg State University of Information Technologies, Mechanics, and Optics,St. Petersburg,Russia |
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| Abstract: | Resonant micro-Raman spectra and the morphology of the interlayer Van der Waals surface are studied for layered thin films of n-Bi2Te3 and solid solutions based on Bi2Te3. It is found that the composition, thickness, surface morphology, and the method of obtaining films affect the relative intensity of Raman phonons, which are sensitive to the topological surface states of Dirac fermions. |
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