| PLCT薄膜的结晶性能研究 |
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| 引用本文： | 袁小武,于光龙,朱建国,肖定全.PLCT薄膜的结晶性能研究[J].哈尔滨理工大学学报,2002,7(6):37-38. |
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| 作者姓名： | 袁小武 于光龙 朱建国 肖定全 |
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| 作者单位： | 四川大学,材料科学系,四川,成都,610064 |
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| 基金项目： | 国家自然科学基金资助(10175045) |
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| 摘 要： | 采用Sol-Gel法制备了（Po0.9-xLa0.1Cax)Ti0.975O3( 简写为PLCT100x)铁电薄膜。利用Siemens D5005型号X射线衍射仪分析了PLCT（x)薄膜的结晶特性，总结出全钙钛矿相的PLCT铁电薄膜的退火工艺。用AFM测试了PLCT（100x)薄膜的表面，发现用Sol-Gel方法制备的薄膜相当平整。
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| 关 键 词： | 结晶性能 PLCT 铁电薄膜 Sol－Gel XRD AFM X射线衍射仪 制备 |
| 文章编号： | 1007-2683(2002)06-0037-02 |
| 修稿时间： | 2002年9月26日 |
Study of Crystal Properties of PLCT Thin Solid Film |
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| YUAN Xiao-wu,YU Guang-long,ZHU Jian - guo,XIAO Ding-quan.Study of Crystal Properties of PLCT Thin Solid Film[J].Journal of Harbin University of Science and Technology,2002,7(6):37-38. |
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| Authors: | YUAN Xiao-wu YU Guang-long ZHU Jian - guo XIAO Ding-quan |
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| Abstract: | The (Pb0.9-xLa0.1Cax)Ti0.975O3(PLCT100x) thin solid films were prepared by Sol-Gel technique. The crystal property of PLCT thin film were analyzed by a D5005 X - ray of diffractor, the annealed technique of whole perovskite phase of PLCT thin films were confirmed. The surface of thin films were analyzed by AFM, which showed that the film was very smooth and continuous. |
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| Keywords: | PLCT ferroelectric thin film Sol-Gel XRD AFM |
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