| 时序电路功能测试生成方法探讨 |
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| 引用本文： | 王红霞,陈志坚,叶晓慧,何光进. 时序电路功能测试生成方法探讨[J]. 仪器仪表用户, 2009, 16(2): 111-112 |
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| 作者姓名： | 王红霞 陈志坚 叶晓慧 何光进 |
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| 作者单位： | 海军工程大学,电子工程学院,湖北武汉430033 |
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| 摘 要： | 研究一种对复杂时序电路行之有效的测试生成的方法，关系到VLSI电路自动测试技术真正付诸实用的问题。本文从时序电路的结构和功能两方面，分析总结了用于数字电路或数字系统的测试生成方法。
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| 关 键 词： | 时序电路 测试生成 功能测试 |
Research on optimizing the fault diagnosis strategy of complex electronic equipments |
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| WANG Hong-xia,CHEN Zhi-jian,YE Xiao-hui,HE Guang-jin. Research on optimizing the fault diagnosis strategy of complex electronic equipments[J]. Electronic Instrumentation Customer, 2009, 16(2): 111-112 |
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| Authors: | WANG Hong-xia CHEN Zhi-jian YE Xiao-hui HE Guang-jin |
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| Affiliation: | Naval University of Engineering;Wuhan 430033;China |
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| Abstract: | The efficient method of test generation aiming to complex sequential system is studied,which connect with the real applied problem of automatic test technology used in VLSI circuit.The test generation method of digital circuit or digital system is analyzed from the way of the configuration and function based on sequential circuit. |
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| Keywords: | sequential system test generation functional test |
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