| 基于小波去噪和去卷积的半导体光放大器增益系数谱测量方法 |
| |
| 引用本文： | 刘磊,张新亮,黄德修.基于小波去噪和去卷积的半导体光放大器增益系数谱测量方法[J].中国激光,2007,34(6):46-850. |
| |
| 作者姓名： | 刘磊 张新亮 黄德修 |
| |
| 作者单位： | 华中科技大学光电子科学与工程学院,湖北,武汉,430074 |
| |
| 基金项目： | 国家高技术研究发展计划(863计划);国家自然科学基金;教育部跨世纪优秀人才培养计划 |
| |
| 摘 要： | 为了提高半导体光放大器(SOA)增益系数谱测量的准确性,减少光谱仪分辨率和系统噪声对测量结果的影响,提出了由传统的Hakki-Paoli(HP)方法改进得到的基于小波去噪和去卷积过程的Hakki-Paoli(HP-DD)方法,分析了其原理,并给出去卷积的算法和小波去噪的原理。在数值模拟中,对模拟的放大自发辐射(ASE)谱进行处理,表明HP-DD方法能较大程度地改善增益系数谱的测量准确度。在实验中,通过对半导体光放大器的放大自发辐射谱进行实际测量,分别用HP-DD方法和HP方法求得增益系数谱,验证了HP-DD方法的测量结果的精确度有很大程度的改善。
|
| 关 键 词： | 测量 半导体光放大器 Hakki-Paoli方法 增益系数谱 小波去噪 反卷积 |
| 文章编号： | 0258-7025（2007）06-0846-05 |
| 收稿时间： | 2006/8/18 |
| 修稿时间： | 2006-08-18 |
Measurement Method for Semiconductor Optical Amplfier Gain Coefficient with Wavelet Denoise and Deconvolution |
| |
| LIU Lei,ZHANG Xin-liang,HUANG De-xiu.Measurement Method for Semiconductor Optical Amplfier Gain Coefficient with Wavelet Denoise and Deconvolution[J].Chinese Journal of Lasers,2007,34(6):46-850. |
| |
| Authors: | LIU Lei ZHANG Xin-liang HUANG De-xiu |
| |
| Affiliation: | Institute of Optoelectronic Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China |
| |
| Abstract: | For improving the measurement precision of the gain coefficient of semiconductor optical amplifier (SOA) and avoiding the influence of the optical spectrum analyzer′s resolution and noise, a Hakki-Paoli (HP) method combined with the wavelet denoise and deconvolution (HP-DD) process was presented. The HP-DD principle including deconvolution algorithm and wavelet denoise was analyzed. Based on the simulated amplified spontaneous emission (ASE) spectrum and measured ASE spectrum, wavelet denoise and deconvolution process were demonstrated to improve the precision of the measurement and the noise tolerance. |
| |
| Keywords: | measurement semiconductor optical amplifier HakkiPaoli method gain coefficient spectrum wavelet denoise deconvolution |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
