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波片相位延迟的精确测量及影响因素分析
引用本文:薄锋,朱健强,康俊.波片相位延迟的精确测量及影响因素分析[J].中国激光,2007,34(6):51-856.
作者姓名:薄锋  朱健强  康俊
作者单位:1. 中国科学院上海光学精密机械研究所高功率激光物理实验室,上海,201800;中国科学院研究生院,北京,100039
2. 中国科学院上海光学精密机械研究所高功率激光物理实验室,上海,201800
基金项目:中国科学院知识创新工程项目
摘    要:提出一种精确测量波片相位延迟的方法。将待测波片置于起偏器和检偏器之间,转动待测波片和检偏器至不同的位置并探测输出的光强,得到波片的相位延迟。采用光源调制技术和解调技术,抑制了连续光所无法克服的背景光干扰和电子噪声的干扰;将光路分为测量光路和参考光路,采用软件除法技术,消除了光源波动的影响,从而实现波片相位延迟的精确测量。详细分析了影响测量精度的误差因素,主要有光源波长变化、温度变化、入射角倾斜、转台转角误差和光源波动,计算了1064 nm波长时厚度为0.52 mm的λ/4多级结晶石英波片产生的相位延迟误差,其中光源波动的影响在作除法后有显著的改善,各误差因素的总测量误差为±1.58°。实际测量了该λ/4结晶石英波片的相位延迟为91.06°±1.78°,与理论分析相符。该测量和误差分析方法同样适合其他的波片。

关 键 词:激光技术  调制光源和解调技术  除法技术  波片  相位延迟  精度分析
文章编号:0258-7025(2007)06-0851-06
收稿时间:2006/10/16
修稿时间:2006-10-16

Precise Measurement and Factors Analysis for Phase Retardation of Wave Plate
BO Feng,ZHU Jian-qiang,KANG Jun.Precise Measurement and Factors Analysis for Phase Retardation of Wave Plate[J].Chinese Journal of Lasers,2007,34(6):51-856.
Authors:BO Feng  ZHU Jian-qiang  KANG Jun
Affiliation:1 Joint Laboratory on High Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China ;2 Graduate University of Chinese Academy of Sciences, Beijing 100039, China
Abstract:A method for precisely measuring the phase retardation of wave plate is presented. In this method, a test wave plate is placed between a polarizer and an analyzer, with the polarizer and the analyzer being rotated to different position, the output power is tested and the phase retardation of the wave plate is reached. The modulated light source and the demodulation technique are used to erase the noises, which are helpless for continuous light, arise from background light and electronics. Since the light path is divided into measurement light path and reference light path and the software division technology is used, the influence of light fluctuation is eliminated and the phase retardation of wave plate can be measured precisely. Main error factors that degrade the measurement accuracy are analyzed in detail, which are wavelength change of the light source, temperature change of surrounding environment, oblique incidence of the light, rotational angle error of the sample carriers and fluctuation of the light power. Phase retardation errors that arise from the above mentioned factors for a piece of crystal quartz plate with thickness of 0.52 mm and phase retardation being 90° at 1064 nm are analyzed and calculated. The influence of light fluctuation is greatly improved after using division technique, and the total error is ±1.58°. The quartz wave plate with thickness of 0.52 mm is tested experimentally, and its phase retardation is 91.06°±1.78°, which consists with the theoretical analysis. Methods about measurement and error analysis can also be used for other wave plates.
Keywords:laser technique  modulated light source and demodulation technique  division technique  wave plate  phase retardation  accuracy analysis
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