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Influence of annealing on the critical temperature of Bi–Pb–Sr–Ca–Cu–O thin films
Authors:E Díaz-Valdés  C Mejía-García  J L López-López  M Jergel
Affiliation:(1) Escuela Superior de Física y Matemáticas, IPN, Edif. 9 UPALM, Av. Politécnico s/n, Mexico, D.F, 07738, Mexico;(2) Departamento de Física, CINVESTAV, IPN, A. P. 14–740, Mexico, D. F, 07300, Mexico
Abstract:Superconducting Bi–Pb–Sr–Ca–Cu–O (BPSCCO) thin films were grown on MgO substrates by a spray pyrolysis technique, followed by a solid-state reaction. The thin films with nominal composition Bi1.65Pb0.4Sr1.2Ca1.2Cu2.5(NO3)δ were grown varying mainly the annealing temperature between 835 and 855 °C in order to observe the influence on the critical temperature Tc. At 855 °C the higher Tc was obtained for the 2212 phase. The thin films were then analyzed by X-ray diffraction, R-T measurements and atomic absorption spectroscopy.
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