| 纳秒激光等离子体光源的光谱测量技术 |
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| 引用本文： | 尼启良.纳秒激光等离子体光源的光谱测量技术[J].光学精密工程,2005,13(2):211-218. |
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| 作者姓名： | 尼启良 |
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| 作者单位： | 中国科学院,长春光学精密机械与物理研究所,应用光学国家重点实验室,吉林,长春,130033 |
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| 基金项目： | 国家自然科学基金重点项目资助(No.60223003)，应用光学国家重点实验室基金 |
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| 摘 要： | 提出了一种新的探测和测量激光等离子体软X射线源光谱强度的方法。此方法使用通道电子倍增器和定标过的硅光电二极管为探测器,前者是非标准探测器,后者为标准探测器。应用电荷灵敏前置放大器和峰值探测器测量探测器产生的电量,并以高分辨率的光谱仪为分光元件,在已知光栅效率、通道电子倍增器增益、硅光电二极管能量响应的条件下,给出了计算激光等离子体软X射线源在某一波长光谱强度的公式。
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| 关 键 词： | 软X射线源 激光等离子体 光谱强度 峰值探测器 |
| 文章编号： | 1004-924X(2005)02-0211-08 |
| 收稿时间： | 2005-02-10 |
| 修稿时间： | 2005年2月10日 |
Technology for measuring spectrum from nanosecond laser plasma soft X-ray source |
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| NI Qi-liang.Technology for measuring spectrum from nanosecond laser plasma soft X-ray source[J].Optics and Precision Engineering,2005,13(2):211-218. |
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| Authors: | NI Qi-liang |
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| Affiliation: | State Key Lab of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China |
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| Abstract: | A method detecting and measuring the intensity of spectrum from laser plasma soft X-ray source is presented. A channel electron multiplier (CEM) and a calibrated silicon photodiode are used as detectors in this method, the former is a nonstandard detector and the latter is a standard one. Charge-sensitive preamplifiers and peak detector are used for measuring total charges generated by detectors, and a monochromator with high resolution is employed as spectrometer, formulae to calculate the intensity of spectrum from laser plasma soft x-ray source is given, based on known the grating efficiency of monochromator, CEM's gain and responsivity of silicon photodiode to photons. |
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| Keywords: | soft X-ray sourcce laser plasma spectrum intensity peak detector |
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