| 双极晶体管不同剂量率的辐射效应和退火特性 |
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| 引用本文： | 陆妩,余学锋,任迪远,艾尔肯,郭旗. 双极晶体管不同剂量率的辐射效应和退火特性[J]. 核技术, 2005, 28(12): 925-928 |
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| 作者姓名： | 陆妩 余学锋 任迪远 艾尔肯 郭旗 |
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| 作者单位： | 中国科学院新疆理化技术研究所,乌鲁木齐,830011;中国科学院新疆理化技术研究所,乌鲁木齐,830011;中国科学院新疆理化技术研究所,乌鲁木齐,830011;中国科学院新疆理化技术研究所,乌鲁木齐,830011;中国科学院新疆理化技术研究所,乌鲁木齐,830011 |
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| 摘 要： | 不同类型和型号的国产及进口双极晶体管的不同剂量率的辐照效应及退火特性进行了研究。结果表明：在辐照的剂量率范围内，无论是国产还是进口的双极晶体管，都有明显的低剂量率辐照损伤增强现象，且NPN管比PNP管的明显。文中对引起双极器件辐照损伤差异的机理进行了探讨。
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| 关 键 词： | 双极晶体管 60Coγ辐照 剂量率效应 退火 |
| 收稿时间： | 2004-12-28 |
| 修稿时间： | 2004-12-282005-03-17 |
Radiation effects and ageing characteristics of bipolar junction transistors subjected to high and low dose rate total dose irradiations |
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| LU Wu,YU Xuefeng,REN Diyuan,E RKIN,GUO Qi. Radiation effects and ageing characteristics of bipolar junction transistors subjected to high and low dose rate total dose irradiations[J]. Nuclear Techniques, 2005, 28(12): 925-928 |
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| Authors: | LU Wu YU Xuefeng REN Diyuan E RKIN GUO Qi |
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| Abstract: | Radiation effects and ageing characteristics were investigated for different types of domestic and/or imported bipolar junction transistors with five dose rates ranging from 100 to 0.002 rad(Si)/s at the same total dose. The results showed that the enhanced low-dose-rate sensitivity (ELDRS) exists in either domestic or imported bipolar transistors, and the NPN transistors are more obvious than PNP ones. Possible mechanism for the effect was discussed. |
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