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关于LED单灯正向电压VF不良的探讨
引用本文:斯芳虎.关于LED单灯正向电压VF不良的探讨[J].电子与封装,2008,8(1):12-15.
作者姓名:斯芳虎
作者单位:厦门三安光电股份有限公司,厦门,361009
摘    要:文章基于LED芯片和LED单灯的工作原理和制程工艺,探讨了LED芯片封装以后正向电压K升高和降低的常见原因,并提出了改善措施。对于GaN基双电极芯片,由于芯片工艺制程或后续封装工艺因素,造成芯片表面镀层(ITO或Ni/Au)与P—GaN外延层之间的结合被破坏,欧姆接触电阻变大。对于GaAS基单电极芯片,由于封装材料和工艺因素,导致芯片背金(N—electrode)与银胶,或银胶与支架之间的接触电阻变大,从而LED正向电压VF升高。LED正向电压VF降低最常见的原因为芯片PN结被ESD或外界大电流损伤或软击穿,反向漏电过大,失去了二极管固有的I-V特性。

关 键 词:正向电压  外延层  欧姆接触  电流扩展  金属有机化合物气相淀积  PN结
文章编号:1681-1070(2008)01-0012-04
收稿时间:2007-09-19
修稿时间:2007年9月19日

Discussion about LED Lamp Forward Voltage VF Failure
SI Fang-hu.Discussion about LED Lamp Forward Voltage VF Failure[J].Electronics & Packaging,2008,8(1):12-15.
Authors:SI Fang-hu
Affiliation:SI Fang-hu (Xiamen Sanan Electronics Co.,Ltd. Xiamen, 361009, China)
Abstract:Base on the principle and manufacture technology of LED Chip & LED Lamp,the article discussed the common reason which LED lamp forward voltage VF will increase or reduce after beening packaged,then pro-posed the improvement measure.For GaN-based dual-pad chip,because of LED chip process technology and packaging technology,the contact between surface deposited layer(ITO Layer or Ni/Au Layer) and P-GaN epitaxial layer is damaged,the resistance of Ohmic-contact is become larger,so the LED forward voltage increased.For GaAs-based single-pad chip,because of packaging materials and process technology,the con-tact resistance between chip backing gold film(N eletrode) and silver-glue(or between silver-glue and lead-frame) become larger,there by increasing LED forward voltage.The most common reason for LED forward voltage reduce is that chip PN-junction was damaged or soft brokedown by ESD or other external high current,resulting in large reverse leakage current,lose diode intrinsic I-V characteristic.
Keywords:forward-voltage  epitaxial-layer  ohmic-contact  current-expansion  MOCVD  PN-junction
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