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Measurement system escape and overkill rate analysis
Authors:Song Fu  Osmo Kauppila  Matti Mottonen
Affiliation:1. Apple Inc, Shenzhen, China
2. Department of Industrial Engineering and Management, University of Oulu, Oulu, Finland
Abstract:In 100% inspection, measurement errors are unavoidable. Due to these errors, acceptable products are sometimes rejected (overkill) and defective products are accepted (escape). Overkill increases production costs, while escape is a source of customer dissatisfaction. This study presents a model for calculating overkill and escape rates using process and measurement system performance data. A practical example of applying the model is also presented to calculate gage reproducibility and repeatability requirements for different production settings. Industrial managers and quality engineers can utilize the results of this study to calculate escape and overkill rates of their production systems, and to assess and improve their processes.
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