|
|||||
|
|
Measuring the complexity of product line architecture with vADL |
|
| Authors: | ZHANG Tao CAO Yan-ping ZHANG Chang-li MA Chun-yan |
| Affiliation: | School of Software and Microelectronics, Northwestern Polytechnical University, Xi＇an 710072, China; 2. School of Science, Xi＇an University of Architecture and Technology, Xi＇an 710055, China) |
| Abstract: | |
| Keywords: | |
| 本文献已被 维普 等数据库收录！ | |