Automatic inspection by lots in the presence of classification errors |
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| Authors: | J. Kittler L.F. Pau |
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| Affiliation: | Department of Nuclear Physics, Oxford University, Oxford, U.K.;Département Electronique et Physique, ENST, 46 rue Barrault, Paris, France |
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| Abstract: | The paper is concerned with the application of pattern recognition to the problem of automatic inspection of products by lots. It is shown that in the presence of classification errors, the classical approach to the design of acceptance sampling plans cannot be used. An alternative quality control procedure is proposed for the model assuming an arbitrary distribution of patterns in the lot. |
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| Keywords: | Classification Error probability Quality control Automatic inspection Acceptance sampling |
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