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双栅GaAs MESFET的计算机辅助测试与分析
引用本文:程兆年,张俊岳,杨兆虎,袁云芳,解健芳. 双栅GaAs MESFET的计算机辅助测试与分析[J]. 固体电子学研究与进展, 1985, 0(2)
作者姓名:程兆年  张俊岳  杨兆虎  袁云芳  解健芳
作者单位:中国科学院上海冶金研究所(程兆年,张俊岳,杨兆虎,袁云芳),中国科学院上海冶金研究所(解健芳)
摘    要:研制了双栅GaAs MESFET的计算机辅助测试系统,可广泛应用于一般四端(或小于四端)器件.该系统包括硬件部分——四端器件直流特性的计算机读入设备FMR,和通用软件部分——FMR-BASIC.同时研制了工艺参数最优化分析程序——DGF TPOA,从而能够自动测报常规直流特性,并由所测结果按最优化技术(单纯形调优法)分析给出工艺参数n、a、L_1、L_2.


Computer-Aided Measurement and Analysis for Dual Gate GaAs MESFETs
Abstract:The design consideration of a computer-aided measurement and analysis system is presented which can carry out the data acquisition and processing for dual gate GaAs MESFETs and other four-terminal (or three-terminal, two terminal) devices. Emphasis has been placed on sampling and software: the data acquisition equipment FMR for DC characteristics as the hardware, the FMR-related program FMR-BASIC as the general software, and the analysis program DGF TPOA for optimal solution of technological parameters. This system is capable of automating the measurement of DC characteristics and the optimizing of the determination of the technological parameters n, a, L1, L2 by simplex method.
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