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新型槽栅MOSFETs的特性
引用本文:曹艳荣,马晓华,郝跃,于磊. 新型槽栅MOSFETs的特性[J]. 半导体学报, 2006, 27(11): 1994-1999
作者姓名:曹艳荣  马晓华  郝跃  于磊
作者单位:西安电子科技大学微电子学院宽,禁带半导体材料与器件教育部重点实验室,西安,710071
基金项目:国家自然科学基金,国家高技术研究发展计划(863计划)
摘    要:采用SIVALCO软件对槽栅与平面器件进行了仿真对比分析,结果表明槽栅器件能够有效地抑制短沟道及热载流子效应,而拐角效应是槽栅器件优于平面器件特性更加稳定的原因.对自对准工艺下成功投片所得沟道长度为140nm的槽栅器件进行测量,结果有力地证明了槽栅器件较平面器件的优越性.

关 键 词:自对准  槽栅器件  短沟道效应  热载流子效应  拐角效应
收稿时间:2015-08-18

Characteristics of Groove-Gate MOSFETs
Cao Yanrong, Ma Xiaohua, Hao Yue, Yu Lei. Characteristics of Groove-Gate MOSFETs[J]. Journal of Semiconductors, 2006, In Press. Cao Y R, Ma X H, Hao Y, Yu L. Characteristics of Groove-Gate MOSFETs[J]. Chin. J. Semicond., 2006, 27(11): 1994.Export: BibTex EndNote
Authors:Cao Yanrong  Ma Xiaohua  Hao Yue  Yu Lei
Affiliation:Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University,Xi’an 710071,China;Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University,Xi’an 710071,China;Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University,Xi’an 710071,China;Key Laboratory of the Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices,School of Microelectronics,Xidian University,Xi’an 710071,China
Abstract:The groove- and planar-gate MOSFETs are compared and analyzed through simulation with the software SIVALCO,and the results show that the groove-gate MOSFETs can suppress short channel and hot carries effects.From the analysis of the field,we find that due to the corner effect,the performance of groove-gate MOSFETs is better than that of the planar.The groove-gate MOSFETs with 140nm channel length fabricated with a self-aligned process are tested,and the results effectively show the superiority of the groove-gate MOSFETs over the planar.
Keywords:self-aligned   groove-gate MOSFETs   short channel effects   hot carries effects   corner effect
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