A new high-brightness stepped-crystal diffractor for X-ray microanalysis |
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| Authors: | M. I. Mazuritsky A. V. Soldatov V. L. Lyashenko E. M. Latush A. T. Kozakov S. I. Shevtsova A. Marcelli |
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| Affiliation: | (1) Faculty of Physics, Rostov State University, Rostov-on-Don, Russia;(2) LNF, INFN, Frascati, Italy |
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| Abstract: | An electron-probe X-ray microanalyzers, the characteristic X-ray radiation is generated within a small volume of sample and the emitting surface area is on the order of 1 μm2. For a distance to analyzer of approximately 0.5 m, this small emitting area can be considered as a point source. Practical implementations of the electron-probe X-ray microanalysis (EPMA) require a high spectral resolution and sufficient intensity. |
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