数显仪特征部分的误差分析

评价了数显仪特征部分误差分析方法,包括:采样/保持电路、模数转换单元的误差,并通过典型例子和列表数据分析了多种误差源及其综合计算方法.此外,还通过对现代动态范围内平均位误差风险因子量化(BERF)的评述,进一步探讨了传统意义上的数值化模拟系统与现代的建立在BERF-ε原理基础上的数显仪量化误差极限分析之间的关系.正因为后者建立在揭示噪声量子涨落性的直方图和量子相关性的功率谱密度测量上,所以能更客观地表征噪声的量子特性.

Error analysis and its progress for characteristic parts of digital instruments

Error analysis of digital instruments on their characteristic parts including sample/holder circuit error and analogue/digital convector error was reviewed in this paper.With the help of some examples and data tables,error origins and the synthetic method were discussed.Besides,the relation ship between the so-called bit resolution in the classical meaning of digital-analogue systems and the analysis of the quantity error limitation of digital instruments based on the average bit-error-risk factor(BERS-ε) principle was also evaluated using the direct introduction of BERS.It is worth while to note that the latter more objectively represents the quantum characteristics of error noise because it is set up besed on the measurement of histom for the random property of noise and the measurement of power spectrum density(PSD) for the quantum co-relation.