A Precision Device for the Positioning of the Probe in Scanning-Probe Microscopy |
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| Authors: | A. V. Zhikharev S. G. Bystrov O. V. Karban' |
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| Affiliation: | (1) Ural Division, Russian Academy of Sciences, Physicotechnical Institute, ul. Kirova 132, Izhevsk, 426001, Russia |
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| Abstract: | A device for positioning of a probe over an area of 1000 × 1000  m with an accuracy of 1 m is described. The device is compatible with scanning-probe microscopes available from the NT-MDT Co. (Zelenograd, Russia). It is shown that the device can be used for the examination of large objects and objects with highly developed surface topography. |
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