Structural Analysis of Inclusions in β-Silicon Carbide Whiskers Grown from Rice Hulls |
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Authors: | Kevin M. Knowles Maharajapuram V. Ravichandran |
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Affiliation: | Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB2 3QZ, United Kingdom |
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Abstract: | Microcrystalline inclusions in the core of β-SiC whiskers derived from the pyrolysis of rice hulls have been studied by transmission electron microscopy using conventional brightfield and dark-field imaging. The electron diffraction patterns from the whiskers show extra reflections arising from these inclusions. Dark-field images from these reflections are consistent with the presence of three different variants of inclusions, all of which are oriented with their [001] axes parallel to the heavily faulted [111] growth axis of the whiskers. A structural model for these inclusions is proposed which accounts satisfactorily for the extra reflections in the electron diffraction patterns. |
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