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MAXIMUM ENTROPY DECONVOLUTION OF XPS PEAK
作者姓名:王典芬  汪海
作者单位:Wang Dianfen Wang HaiCentre of Material Research & Analyses,Wuhan University of Technology Wuhan,430070,P. R. China
摘    要:Necessity of XPS spectrum,deconvolution,disadvantages of the traditional Fast Fourier Tranderm decon-volution method(FFT),princtple,method and advantage ofMaximum Entropy Deconvolution Method (MEM) are de-scribed.Criteria for determing the number of data points sam-pled in MEM are the main point disccussed in the paper,someXPS deconvolution applications of our MEM software showthat the MEM makes XPS deconvolution much easier than thetraditional FFT method.


MAXIMUM ENTROPY DECON- VOLUTION OF XPS PEAK
Wang Dianfen Wang HaiCentre of Material Research & Analyses,Wuhan University of Technology Wuhan,P. R. China.MAXIMUM ENTROPY DECONVOLUTION OF XPS PEAK[J].Journal of Wuhan University of Technology. Materials Science Edition,1994(4).
Authors:Wang Dianfen Wang HaiCentre of Material Research & Analyses  Wuhan University of Technology Wuhan    P R China
Affiliation:Wang Dianfen Wang HaiCentre of Material Research & Analyses,Wuhan University of Technology Wuhan,430070,P. R. China
Abstract:Necessity of XPS spectrum deconvolution, disadvantages of the traditional Fast Fourier Transform decon-volution method (FFT) , principle, method and advantages of Maximum Entropy Deconvolution Method (MEM) are de-scribed. Criteria for determing the number of data points sam-pled in MEM are the main point disccussed in the paper,some XPS deconvolution applications of our MEM software show that the MEM makes XPS deconvolution much easier than the traditional FFT method.
Keywords:X-ray photoelectron spectrum (XPS) peak  maximum entropy decovolution method (MEM) software
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