Solution-processed BiFeO3 thin films with low leakage current |
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Affiliation: | 1. Luxembourg Institute of Science and Technology, Materials Research and Technology Department, 41 rue du Brill, L-4422 Belvaux, Luxembourg;2. University of Luxembourg, 41 rue du Brill, L-4422 Belvaux, Luxembourg;3. Jozef Stefan Institute, Electronic Ceramics Department, Jamova cesta 39, 1000 Ljubljana, Slovenia |
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Abstract: | Bismuth ferrite (BiFeO3) is an attractive multiferroic material that shows strong ferroelectric and antiferromagnetic properties. Nevertheless, producing high-quality oriented BiFeO3 on technology-important platinized silicon substrates by low-cost solution deposition methods is still challenging. In this work, polycrystalline Mn and Ti co-doped BiFeO3 (BFO) thin films were fabricated on platinized silicon substrates by a solution deposition method. PbTiO3 nanocrystals were used as a seed layer between the electrode and the BFO thin films to induce a preferential (100) pseudocubic orientation. We show that the introduction of a PbTiO3 seed layer strongly reduces the leakage current. The films show excellent room-temperature ferroelectric properties at low frequencies (300 Hz), with epitaxial-like remanent polarization as high as 51 μC/cm2 and coercive field of 500 kV/cm. |
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Keywords: | Ferroelectric Chemical solution deposition Thin film Multiferroic |
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