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Assessment of redundant systems with imperfect coverage by means of binary decision diagrams
Authors:Albert F. Myers  Antoine Rauzy  
Affiliation:aNorthrop Grumman Corporation, 1840 Century Park East, Los Angeles, CA 90067-2199, USA;bIML/CNRS, 163, Avenue de Luminy, 13288 Marseille Cedex 09, France
Abstract:In this article, we study the assessment of the reliability of redundant systems with imperfect fault coverage. We term fault coverage as the ability of a system to isolate and correctly accommodate failures of redundant elements. For highly reliable systems, such as avionic and space systems, fault coverage is in general imperfect and has a significant impact on system reliability. We review here the different models of imperfect fault coverage. We propose efficient algorithms to assess them separately (as k-out-of-n selectors). We show how to implement these algorithms into a binary decision diagrams engine. Finally, we report experimental results on real life test cases that show on the one hand the importance of imperfect coverage and on the other hand the efficiency of the proposed approach.
Keywords:Imperfect coverage of redundant systems   k-out-of-n systems   Binary decision diagrams
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