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一种高性能InP基谐振隧穿二极管的研制
引用本文:齐海涛,冯震,李亚丽,张雄文,商耀辉,郭维廉.一种高性能InP基谐振隧穿二极管的研制[J].半导体学报,2007,28(12):1945-1948.
作者姓名:齐海涛  冯震  李亚丽  张雄文  商耀辉  郭维廉
作者单位:[1]天津大学电子信息工程学院,天津300072 [2]中国电子科技集团公司第十三研究所,石家庄050051
基金项目:国防重点实验室基金 , 中国博士后科学基金
摘    要:设计并用分子束外延技术生长了InP基InGaAs/AlAs体系RTD材料,采用传统湿法腐蚀、光学接触式光刻、金属剥离、台面隔离和空气桥互连工艺,研制出了具有优良负阻特性和较高阻性截止频率的InP基RTD单管,器件正向PVCR为17.5,反向PVCR为28,峰值电流密度为56kA/cm^2,采用RNC电路模型进行数据拟合后得到阻性截止频率为82.8GHz,实验为今后更高性能RTD单管的研制,以及RTD与其他高速高频三端器件单片集成电路的设计与研制奠定了基础。

关 键 词:谐振隧穿二极管  InP  负阻  阻性截止频率
文章编号:0253-4177(2007)12-1945-04
修稿时间:7/6/2007 4:42:11 PM

Fabrication of a High-Performance RTD on InP Substrate
Qi Haitao,Feng Zhen,Li Yali,Zhang Xiongwen,Shang Yaohui,Guo Weilian.Fabrication of a High-Performance RTD on InP Substrate[J].Chinese Journal of Semiconductors,2007,28(12):1945-1948.
Authors:Qi Haitao  Feng Zhen  Li Yali  Zhang Xiongwen  Shang Yaohui  Guo Weilian
Affiliation:School of Electronic Information Engineering,Tianjin University,Tianjin 300072,China; The 13th Research Institute,CETC,Shijiazhuang 050051,China;School of Electronic Information Engineering,Tianjin University,Tianjin 300072,China;School of Electronic Information Engineering,Tianjin University,Tianjin 300072,China;School of Electronic Information Engineering,Tianjin University,Tianjin 300072,China;School of Electronic Information Engineering,Tianjin University,Tianjin 300072,China;School of Electronic Information Engineering,Tianjin University,Tianjin 300072,China; The 13th Research Institute,CETC,Shijiazhuang 050051,China
Abstract:InGaAs/AlAs RTD material structure on InP substrate is designed and grown by molecular beam epitaxy.A device with good negative differential resistance characteristics and a higher resistive cutoff frequency is fabricated using mesa isolation,metal lift-off,wet chemical etch,and air bridge technologies.The forward bias peak-to-valley current ratio (PVCR) and reverse bias PVCR are about 17.5 and 28,respectively.The peak current density is 56kA/cm2,and the data fitting resistive cutoff frequency using an RNC circuit model is 82.8GHz.The experiment lays a foundation for the design and fabrication of high-performance RTD and monolithic integration circuits of RTD and other high speed and high frequency three terminal devices.
Keywords:resonant tunneling diode  InP  negative differential resistance  resistive cutoff frequency
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