Effects of interface roughness on the spectral properties of thin films and multilayers |
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Authors: | Tikhonravov Alexander V Trubetskov Michael K Tikhonravov Andrei A Duparré Angela |
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Affiliation: | Research Computing Center, Moscow State University, Leninskie Gory, 119992, Moscow, Russia. tikh@tikh.srcc.msu.su |
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Abstract: | We introduce two parameters, large-scale and small-scale rms roughness, to take into account the interface properties of thin films and multilayers in the calculation of their specular reflectance and transmittance. A theoretical motivation for the introduction of these two parameters instead of a standard single rms roughness is provided. Experimental power spectral density functions of several samples are used to illustrate ways in which the parameters introduced can be evaluated. |
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