| 用Visual Basic 6.0编程实现显微图像测量 |
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| 引用本文： | 余厚云,邓善熙,杨永跃,丁兴号. 用Visual Basic 6.0编程实现显微图像测量[J]. 微计算机信息, 2003, 0(2): 67-68 |
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| 作者姓名： | 余厚云 邓善熙 杨永跃 丁兴号 |
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| 作者单位： | 230009,安徽,合肥,合肥工业大学仪器仪表学院检测技术研究所 |
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| 摘 要： | Visual Basic 6.0具有强大的图形图像处理功能,并广泛应用于图形设计、图像处理及多媒体技术中。本文着重介绍了Visual Basic 6.0在实现显微图像测量中的编程技术,并应用于半导体芯片尺寸测量。
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| 关 键 词： | 半导体芯片 显微技术 图像测量 Visual Basic 6.0编程 |
| 修稿时间： | 2002-09-25 |
The micro-measurement of image based on Visual Basic 6.0 programming |
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| Yu,Houyun Deng,Shanxi Yang,Yongyue Ting,Xinghao. The micro-measurement of image based on Visual Basic 6.0 programming[J]. Control & Automation, 2003, 0(2): 67-68 |
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| Authors: | Yu Houyun Deng Shanxi Yang Yongyue Ting Xinghao |
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| Abstract: | Visual Basic has a strong function in image processing and it is widely used in the design of graph, image processing and multimedia. This paper focuses on the Visual Basic programming in the micro - measurement of image. The research result has been used in dimension measurement of semiconductor wafer. |
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| Keywords: | semiconductor wafer micro-technique image measurement Visual Basic programming |
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