线性阵列逆向调制器反射光强测试实验研究

为了分析逆向调制器的反射光场和反射光强的变化规律,利用532 nm激光照射逆向调制器阵列,测试得到了离焦量、入射角变化时的逆向调制器的反射光场和反射光强,得到了阵列调制器反射光强与单个逆向调制器反射光强关系.测试结果表明,一定范围的正离焦使反射光束发散角变小,反射光能量聚焦度好,负离焦相反.入射角使反射光场发生畸变,反...

Experimental research on measurement of reflectedlight intensity of array retro reflected modulator

In order to analyze the variation of the reflected light field and the reflected light intensity of the retro reflected modulator,the array retro reflected modulator is illuminated by a 532 nm laser.The reflected light field and reflected light intensity value are obtained when the amount of defocus and the incident angle are changed.The reflected light intensity relationship between the array modulator and a single modulator is obtained.The test results show that the positive defocus in a certain range makes the divergence angle of the reflected beam smaller,the energy of the reflected light is better,and the negative defocus is opposite.The incident angle is the distortion of the reflected light field,and the reflected light intensity is inversely proportional to the incident angle.When no defocusing or negative defocusing,the reflected light intensity of the array modulator is a linear superposition of the reflected light intensity of single modulator.