1064 nm激光光热效应对CCD探测器干扰实验研究

为了研究激光的光热效应对CCD探测器的干扰效应,利用1064 nm激光开展了对CCD探测器的干扰实验。实验采集数字图像的处理分析可明显观察到1064 nm激光对于CCD探测器的串扰现象。进行了激光照射CCD探测器随时间变化产生热噪声差对比实验,观察到了激光光热效应对于CCD探测器的干扰效果。实验表明CCD探测器表面温度随1064 nm激光辐照功率的升高而逐渐升高的现象,由于光热效应带来的图像热噪声明显影响到了CCD探测器的成像效果。由于硅基CCD探测器对1064 nm波长的低光电响应率,研究光热效应对CCD探测器干扰效应尤为重要。

Experimental study on CCD detector jammed by 1064 nm laser photothermal effect

In order to study the interference of laser photothermal effect to CCD detector,interfering experiments of the CCD detector with 1064nm laser were carried out.Through the processing and analysis of the digital image,the crosstalk of the CCD detector caused by 1064nm laser can be observed.The contrast experiment of the thermal noise caused by laser radiation of the CCD detector with time change was carried out,and the interference effect of laser photothermal effect on CCD detector was observed.The results show that surface temperature of the CCD detector rises with the increase of 1064nm laser irradiation power.Because of the low quantum efficiency of the silicon-based CCD detector to the light with wavelength of 1064nm,it is very important to study the effect of photothermal effect on CCD detector.