Effects of ZrO2 substitution on crystal structure and microwave dielectric properties of Zn0.15Nb0.3(Ti1-xZrx)0.55O2 ceramics |
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Affiliation: | 1. National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu 610054, People''s Republic of China;2. Key Laboratory of Multi-Spectral Absorbing Materials and Structures of Ministry of Education, University of Electronic Science and Technology of China, Chengdu 610054, People''s Republic of China;3. Institute of Electronic and Information Engineering of UESTC in Guangdong, Dongguan 523808, People''s Republic of China |
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Abstract: | In this study, the influence of substitution of Zr for Ti on crystal structure and microwave dielectric properties of Zn0.15Nb0.3(Ti1-xZrx)0.55O2 (0 ≤ x ≤ 0.7) ceramics were discussed through Rietveld refinement, normalized bond analysis and complex chemical bond theory. Rietveld refinement analysis indicated that a composite could be formed for x ≤ 0.22. Pure orthorhombic type (O-type) solid solutions are prepared in the region of x = 0.3–0.7. With the increasing amount of ZrO2, cell volume of O-type phase increases, and it results in the enlarging and compressing behaviors of chemical bonds. Under the circumstances, the dielectric polarizability is deteriorated because of the reducing chemical bond covalency value (fc), and this finding is also confirmed by Clausius-Mosotti equation. Lattice energy of Zr–O1 bonds and grain size distribution of sintered specimens are mainly responsible for the variations of quality factor (Q × f) value. Chemical bond energy (E) is closely related with the temperature coefficient of resonant frequency value (τf). Typical microwave dielectric properties of Zn0.15Nb0.3(Ti1-xZrx)0.55O2 ceramics (x = 0.22) were obtained when sintered at 1100 °C: εr = 46.31, Q × f = 30,297 GHz, τf = -8.24 ppm/°C. |
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Keywords: | Ceramic Chemical bond Microwave dielectric properties |
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