Crystallographic evaluation of ZnSe crystals by x-ray diffraction

Crystallographic quality and the lattice constant of ZnSe crystals grown from Te/ Se solutions by the temperature gradient solution growth method were evaluated by using a high resolution x-ray diffractometer. The full width at half maximum of the x-ray rocking curve was 5.7 sec, a value almost equivalent to that of GaAs. The distribution of crystallographic properties along the growth direction was nearly the same excepting just on the heat-sink. The accurate lattice constant of the ZnSe crystal measured by this system was 5.6700 ± 0.000025 A.