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Growth of phosphorus-doped p-type ZnO thin films by MOCVD
Authors:Zhizhen YE  Jingrui WANG  Yazhen WU  Xincui ZHOU  Fugang CHEN  Weizhong XU  Yan MIAO  Jingyun HUANG  Jianguo LU  Liping ZHU  Binghui ZHAO
Affiliation:State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, China
Abstract:Phosphorus-doped p-type ZnO thin films are prepared on glass substrates by metalorganic chemical vapor deposition (MOCVD). DEZn, O2, and P2O5 powders are used as reactant and dopant sources. The p-type ZnO films are grown at a temperature between 673 K and 723 K. The best p-type sample has a low resistivity of A strong emission peak at 3.354 eV corresponding to neutral acceptor bound excitons is observed at 77 K in the photoluminescence spectra, which further verifies the p-type characteristics of the films.
Keywords:p-type ZnO  metalorganic chemical vapor deposition (MOCVD)  phosphorus-doping Acknowledgements This work was supported by the National
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