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RFI-induced distortion in switched-capacitor circuits
Authors:Crovetti  PS Fiori  FL
Affiliation:Dipt. di Elettronica, Politecnico di Torino, Italy;
Abstract:The errors which are induced by radio-frequency interference (RFI) in switched-capacitor (SC) circuits are discussed and the main role played by the distortion of MOS switches in the on-state is highlighted. Furthermore, a new simple analytical model, which enables one to predict RFI-induced errors in SC circuits is proposed and it is validated by the comparison of its predictions with time-domain computer simulation results.
Keywords:
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