X射线半值层测量方法研究

根据ISO 4037建立了窄谱系列规范辐射质,研究了射束宽窄与探测距离对X射线半值层测量的影响.结果显示:当X射线能量较高时,在半值层的测量中,不可忽略散射的影响,需要在窄束下测量;在依据ISO 4037建立的窄谱X射线半值层的测量中,当管电压高于60 kV,对应的射束的能量高于45.8 keV时,需要在窄柬测量;适当的增加探测距离也可减少散射对半值层测量的影响.

Study of X-ray Half-value-layer Measurement Methods

According to ISO 4037,the narrow spectrum series standard radiation are bulid,then the standard radiation is used to study the influence on the narrow and broad beam condition and the detection distance on X-ray half-value-layer measurement.When the energy of X-ray up to some degree,the influence of the scatter cannot be ignored and it needs to measure the X-ray half-value-layer in narrow beam condition.When measure the half-value-layer of the narrow spectrum X-ray that established according to ISO 4037,it should be done the job under the narrow beam condition when the tube voltage higher than 60 kV.When the energy of the beam is higher than 45.8 keV,scattering can not be ignored,the half-value-layer measurement need to be done under the narrow beam condition.When the half-value-layer under the broad beam condition is measured,the influence of the scattering can be reduced according to increase the detection distance in proper range.