Biaxially aligned YBCO film tapes fabricated by all pulsed laser deposition |
| |
| Affiliation: | 1. National Institute of Materials Physics, 77125 Bucharest-Magurele, Romania;2. University of Bucharest, Faculty of Physics, 77125 Bucharest-Magurele, Romania;3. National Institute of Laser, Plasma, and Radiation Physics, 77125 Bucharest-Magurele, Romania;4. Department of Engineering and Applied Sciences, Sophia University, Tokyo 102-8554, Japan;5. Department of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan;1. Department of Applied Physics, Tokyo University of Agriculture and Technology, Naka-cho 2-24-16, Koganei, Tokyo 184-8588, Japan;2. NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan |
| |
| Abstract: | Biaxially aligned yttria-stabilized zirconia (YSZ) films on Ni-based alloy substrates were realized with high deposition rate of 0.5 μm min−1 by the inclined substrate deposition (ISD) technique without ion beam assistance. The microstructure of YSZ was examined to study the growth mechanism of biaxial alignment by ISD. Columnar structures toward the plasma plume suggested a self-shadowing effect in the ISD process. To raise Ic values, YBCO thickness was increased up to 5 μm. Thick YBCO films with high Jc values were realized on the ISD-grown YSZ. Long YBCO tapes with biaxial alignment were successfully fabricated using continuous pulsed laser deposition and a high Ic value of 37.0 A (77.3 K, 0 T) at a 75 cm voltage tap spacing was achieved. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
