基于光干涉原理的液晶空盒盒厚测量

液晶空盒厚决定了液晶盒中液晶层的厚度，对整个液晶显示器件的光电特性、底色及响应速度等有很大的影响。因此，如何准确地测量空盒盒厚具有实际的应用价值；本文从光干涉原理出发，推导出测量液晶空盒盒厚的简单而准确的方法，此方法适用于各种排列及任意扭曲角的液昌空盒，具有误差小、设备简单、操作简便等特点，充分满足了液晶显示器件生产厂家进行盒厚过程监控和优化年设计的需要。

Measurement of The Liquid Crystal Hollow Cell Gap Based on Spectral Interferometric Principle

The liquid crystal hollow cell gap decides the gap of liquid crystal layer in one liquid crystal cell and has an important effect on the display quality such as the characteristic of photoelectricity , the color of background and the responding speed. Hence, measuring of the liquid crystal hollow cell gap have an important significance in practice. In this paper , the spectral interferometric principle is used to deduce the method for measurement of the liquid crystal hollow cell gap , which is fit to every kinds of liquid crystal hollow cell gap and is practical , simple and accurate , reaching the necessity of the manufacture in controlling the fabrication processes and designing processes to achieve high-quality display.