Grain-boundary scattering in aluminium films deposited on to calcite substrate |
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Authors: | S. K. Bandyopadhyay A. K. Pal |
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Affiliation: | (1) Department of General Physics and X-rays, Indian Association for the Cultivation of Science, 700032 Calcutta, India |
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Abstract: | Electrical resistivity and temperature coefficient of resistivity of polycrystalline aluminium films deposited onto calcite substrates have been measured in situ. It was observed that films deposited at 130° C substrate temperature show reversible and reproducible behaviour with thermal cycling. The grain-boundary scattering theory of Mayadas and Shatzkes reproduces the experimental observations quite faithfully with the coefficient of specular reflection p=0 and grain-boundary reflection coefficient R=0.38 indicating that the grain-boundary scattering plays a significant role in electron transport in aluminium film deposited on to calcite substrate. |
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