| 电子测试系统的硬件通用设计 |
| |
| 引用本文： | 刘飞. 电子测试系统的硬件通用设计[J]. 电子测试, 2022, 0(2): 24-25. DOI: 10.3969/j.issn.1000-8519.2022.02.008 |
| |
| 作者姓名： | 刘飞 |
| |
| 作者单位： | 中国电子科技集团第29所,四川成都,611731 |
| |
| 摘 要： | 在电子产品多品种、小批量的背景下,给所有产品逐一构建测试环境,不仅不经济、而且研制生产进度也不允许.构建一种通用的测试设备就成了研究的重点.本文探讨测试系统中数字板卡的通用设计.
|
| 关 键 词： | 通用测试 FPGA 微波测试 |
General hardware design of electronic test system |
| |
| Liu Fei. General hardware design of electronic test system[J]. Electronic Test, 2022, 0(2): 24-25. DOI: 10.3969/j.issn.1000-8519.2022.02.008 |
| |
| Authors: | Liu Fei |
| |
| Affiliation: | (The29th Research Institute of China Electronics Technology Group Corporation,Chengdu Sichuan,611731) |
| |
| Abstract: | Under the background of multiple varieties and small batches of electronic products,the testing environment is built for all products one by one,which is not only not economic,but also the development and production progress is not allowed.Building a universal test device has become the focus of research.This paper discusses the general design of digital board cards in the test system. |
| |
| Keywords: | General Test FPGA Microwave test |
| 本文献已被 维普 万方数据 等数据库收录！ |
|
