| COB封装LED器件寿命评价方法研究 |
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| 引用本文： | 张晨朝.COB封装LED器件寿命评价方法研究[J].电子测试,2020(6):48-49,62. |
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| 作者姓名： | 张晨朝 |
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| 作者单位： | 中国电子科技集团公司第十三研究所 |
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| 摘 要： | COB封装的LED器件应用日趋广泛,但是其寿命评价方法仍限于做3000h或6000h的光通维持率试验,试验本身耗时较长,因此本文基于半导体器件的指数衰减规律和LED光通量的慢退化特性提出一种加速试验方法,对器件进行高温加速寿命试验,并对试验结果进行计算,得到了器件在加速试验温度下的L70寿命,然后利用相应水平的激活能,得到了在较低结温下的L70寿命。
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| 关 键 词： | LED器件 COB封装 加速试验 寿命评价 |
Research on life evaluation method of LED devices in COB package |
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| Zhang Chenzhao.Research on life evaluation method of LED devices in COB package[J].Electronic Test,2020(6):48-49,62. |
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| Authors: | Zhang Chenzhao |
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| Affiliation: | (The 13th Research Institute,CETC,Shijiazhuang Hebei,050000) |
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| Abstract: | The LED devices in COB packaging has been extensively applied,those life were still evaluated by 3000h or 6000h light flux maintenance test,which was time-consuming.Therefore,based on the exponential decay law of semiconductor devices and the slow degradation characteristics of LED luminous flux,an accelerated test method is proposed in this paper,The L70 lifetime of the device at the accelerated test temperature is obtained by high temperature accelerated life test and calculation of the test results.Then the L70 lifetime at lower junction temperature is obtained by using the corresponding activation energy. |
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| Keywords: | LED devices COB packaging accelerated test life evaluation |
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