Characterization of multiple deep level systems in semiconductor junctions by admittance measurements |
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Authors: | M. Beguwala C.R. Crowell |
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Affiliation: | Departments of Electrical Engineering and Materials Science, University of Southern California, Los Angeles, California 90007, USA |
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Abstract: | The small signal admittance, Y, of a junction device, in the presence of deep lying majority carrier traps, is obtained as a solution to a simple differential equation (dC/dχ) = (C2/ε)?(ρac/ψac), where C | |
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