Accurate fitting of measured reflectances using a Shifted Gamma micro‐facet distribution

Material models are essential to the production of photo‐realistic images. Measured BRDFs provide accurate representation with complex visual appearance, but have larger storage cost. Analytical BRDFs such as Cook‐Torrance provide a compact representation but fail to represent the effects we observe with measured appearance. Accurately fitting an analytical BRDF to measured data remains a challenging problem. In this paper we introduce the SGD micro‐facet distribution for Cook‐Torrance BRDF. This distribution accurately models the behavior of most materials. As a consequence, we accurately represent all measured BRDFs using a single lobe. Our fitting procedure is stable and robust, and does not require manual tweaking of the parameters.