Surface-Inspection-Pad (SIP)

Surface Inspection Pad (SIP) – A novel approach to resource-efficient sampling for contamination control of component surfaces The Surface Inspection Pad, or SIP for short, offers a cost-effective and resource-saving alternative to sampling for vacuum-assisted contamination control of component surfaces. The analysis of the surface chemistry of the component is then carried out by analyzing the SIP surface. In addition to other methods, surface-sensitive time-of-flight secondary ion mass spectrometry (ToF-SIMS) can be used for the analysis. The components to be examined therefore no longer must be removed from the process and destroyed for the analysis. The user can save enormous costs in this way. Furthermore, SIPs can be used for contamination control in lubricant circuits and liquids. To date, silicone oil (PDMS) has been detected in liquids with a detection limit of less than 10^–6 (ppm).