A generalized fault simulator for combinational logic circuits

A generalized approach to the design of fault simulator using a library of simulation primitives is presented in this paper. A comprehensive set of simulation primitives has been developed using C programming language on the IBM PC. This library of simulation primitives has been used in realizing a fault simulator for automatic test pattern generation in combinational logic circuits. The fault simulator employs a combination of random pattern generation, concurrent fault simulation and the FAN algorithm for generating the complete set of test vectors to cover all the faults in the fault dictionary of the circuit under test. The library of simulation primitives is general enough to facilitate the development of fault simulators using any other test algorithms such as DALG or PODEM.