Seebeck effect in polycrystalline semiconductors

The paper deals with the interpretation of the Seebeck coefficient measured for a polycrystalline semiconductor. Polycrystalline semiconductors are considered to be composed of grains separated from one another by intergrain domains. An isotype heterojunction with a certain density of interface states is assumed to exist at the grain-intergrain domain interface.The general formula for the Seebeck coefficient under these conditions is derived. The relations valid for systems of practical interest are shown as limiting cases of the formula presented.