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| A NEW EXX SYSTEM AND ITS APPLICATIONS | |
| 引用本文： | 邬显慷,曾宪周,孙永年,杨福家. A NEW EXX SYSTEM AND ITS APPLICATIONS[J]. 核技术(英文版), 1990, 0(Z1) |
| 作者姓名： | 邬显慷 曾宪周 孙永年 杨福家 |
| 作者单位： | Fudan University Shanghai 200433 China，Fudan University Shanghai 200433 China，Fudan University Shanghai 200433 China，Fudan University Shanghai 200433 China |
| 摘 要： | IXX (or PIXE-induced XRF) technique gains two main advantages over conventional PIXE method. First, it can be used to avoid or significantly reduce background and spectral interferences from major elements in the sample by proper selecting the primary target. Second, target damage is greatly reduced, so that it is more suitable for the analysis of heatsensitive and delicate specimens. A new IXX system with a very tight geometry is described. Some of its performances and preliminary applications are presented. |
A NEW EXX SYSTEM AND ITS APPLICATIONS |
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| Wu Xiankang Zeng Xianzhou Sun Yongnianand Yang Fujia. A NEW EXX SYSTEM AND ITS APPLICATIONS[J]. , 1990, 0(Z1) | |
| Authors: | Wu Xiankang Zeng Xianzhou Sun Yongnianand Yang Fujia |
| Abstract: | IXX (or PIXE-induced XRF) technique gains two main advantages over conventional PIXE method. First, it can be used to avoid or significantly reduce background and spectral interferences from major elements in the sample by proper selecting the primary target. Second, target damage is greatly reduced, so that it is more suitable for the analysis of heatsensitive and delicate specimens. A new IXX system with a very tight geometry is described. Some of its performances and preliminary applications are presented. |
| Keywords: | P1XE XRF IXX Matrix effect Target damage |
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