Life test of an X-band MMIC multi-function chip for active phased array radar applications |
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| Affiliation: | 1. Satellite & Wireless Convergence Research Department, Electronics and Telecommunications, 218 Gajeong-ro, Yuseong-gu, Daejeon 305-700, Republic of Korea;2. Ace Technology, 237, Namdongseo-ro, Namdong-gu, Incheon 405-849, Republic of Korea;1. University of Applied Sciences Jena, Department of SciTec, 07745 Jena, Germany;2. Fraunhofer Institute of Ceramic Technologies and Systems, 07629 Hermsdorf, Germany;3. Ilmenau University of Technology, Department of Electrical Engineering & Information Technology, 98693 Ilmenau, Germany;1. Department of Mechanical and Aerospace Engineering, The Hong Kong University of Science and Technology, Kowloon, Hong Kong;2. Lightning Optoelectronic Technology (SZ) Co., Ltd., Shenzhen, China;1. Integrated Surface Technologies, Inc., Menlo Park, CA 94025, USA;2. School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287-6106, USA;1. Swerea IVF AB, Argongatan 30, SE-43153 Mölndal, Sweden;2. Department of Microtechnology and Nanoscience (MC2), Chalmers University of Technology, Kemivägen 9, Se 412 96 Göteborg, Sweden;3. Eberspächer Exhaust Technology GmbH & Co. KG, Heinrich-Hertz-Straße 10, 59423 Unna, Germany;1. School of Electrical and Electronic Engineering, Yonsei University, Seoul, Republic of Korea;2. Research and Development Division, SK Hynix Semiconductor Inc., Incheon, Republic of Korea |
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| Abstract: | A 1000-h steady state life test at a temperature of 125 °C was performed on ten X-band MMIC multifunction chips for use in active phase array radar systems. Internal switches, phase shifters, and attenuators were operated through an integrated serial-to-parallel converter under the five-second stepped external control signal for the life test period. None of the ten samples failed under the failure criteria based on the JEP118 standard. The calculated failure rate using the Chi Square Statistic was 1.6 e−6 failures/h for the 90% confidence level. Maximum DC current variation was +16% for an initial value. Maximum variations of small signal gain, phase shift, and attenuation were 0.96 dB, 2°, and 0.17 dB, respectively, over a frequency range of 8.5–10.5 GHz. |
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| Keywords: | Steady state life test Failure rate Multifunction chip (MFC) Serial-to-parallel converter (SPC) Digital attenuator Digital phase shifter |
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