| 类椭圆特征自动识别及亚像素提取的完整实现 |
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| 引用本文： | 薛婷,孙梅,张涛,吴斌. 类椭圆特征自动识别及亚像素提取的完整实现[J]. 光电子．激光, 2008, 19(8) |
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| 作者姓名： | 薛婷 孙梅 张涛 吴斌 |
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| 作者单位： | 天津大学电气与自动化工程学院,天津,300072;天津内燃机研究所,天津,300072;天津大学精密测试技术及仪器国家重点实验室,天津,300072 |
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| 基金项目： | 国家自然科学基金资助项目(50705065); 天津市自然科学基金资助项目(08JCYBJC10000) |
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| 摘 要： | 针对视觉检测中高精度、自动化类椭圆图像特征提取的需要，提出一种类椭圆特征自动识别和中心亚像素定位的完整实现方法。方法中采用基于类椭圆边缘属性对特征区域进行自动识别，采用最小二乘椭圆拟合精确求取类椭圆亚像素定位中心。实验表明，基于该解决方案，可以实现类椭圆特征的自动识别及椭圆中心的亚像素定位，定位算法精度较高，鲁棒性强，同时简便易行，不需要人机交互，可以很好地满足视觉检测仪器化需求。
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| 关 键 词： | 类椭圆特征 自动识别 亚像素 边缘属性 |
Complete approach to automatic identification and sub-pixel center location for ellipse feature |
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| XUE Ting,SUN Mei,ZHANG Tao,WU Bin. Complete approach to automatic identification and sub-pixel center location for ellipse feature[J]. Journal of Optoelectronics·laser, 2008, 19(8) |
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| Authors: | XUE Ting SUN Mei ZHANG Tao WU Bin |
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| Affiliation: | XUE Ting1,SUN Mei2,ZHANG Tao1,WU Bin3(1.College of Electrical , Automation Engineering,Tianjin University,Tianjin 300072,China,2.Tianjin Engine Research Institute,3.State Key Laboratory of Precision Measuring Technology , Instruments,China) |
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| Abstract: | To meet the need of automatic image features extraction with high precision in visual inspection,a complete approach to achieve automatic identification and sub-pixel center location for similar-ellipse feature is proposed with correlative key technologies.In the method,the automatic identification of feature area is fulfilled based on the edge attribute,and the sub-pixel center location is accomplished with the least-square approach.The experimental result show that automatic identification and higher prec... |
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| Keywords: | similar-ellipse feature automatic identification sub pixel edge attribute |
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