| 蒙特卡罗方法在X射线荧光分析中的一些应用 |
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| 引用本文： | 范钦敏,刘亚文,李道伦,韩俊英. 蒙特卡罗方法在X射线荧光分析中的一些应用[J]. 核技术, 1985, 0(3) |
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| 作者姓名： | 范钦敏 刘亚文 李道伦 韩俊英 |
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| 作者单位： | 中国科学院高能物理研究所(范钦敏，刘亚文，李道伦)，中国科学院高能物理研究所(韩俊英) |
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| 摘 要： | 本文给出了荧光过程的蒙特卡罗模拟,着重考虑了几种散射过程对特征X射线强度的影响。对几 种纯元素,计算了单位辐射下特征X射线的强度,与实验值取得了较好的一致。
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| 关 键 词： | 蒙特卡罗方法 X射线荧光分析 散射校正 |
Application of Monte Carlo method for X-ray fluorescence analysis |
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| Fan Qinmin Liu Yawen Li Daolun Han Junying. Application of Monte Carlo method for X-ray fluorescence analysis[J]. Nuclear Techniques, 1985, 0(3) |
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| Authors: | Fan Qinmin Liu Yawen Li Daolun Han Junying |
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| Abstract: | Monte Carlo method has deen applied to simulate the energy dispersive X-ray fluorescence course. The influences of the scattering processes of incident line in sample upon the intensity of the characteristic X-ray have particularly been considered in the simulation model separately. The intensities of the characteristic line for some pure elements under the unit incident radiation were calculated, and good agreement was obtained between the calculated and experimental results. |
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| Keywords: | Monte Carlo method X-ray fluorescence analysis scattering correction |
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