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基于虚拟仪器的IGBT电气参数自动测试系统
引用本文:姚丹,周雒维,方鑫,杜雄,孙鹏菊,吴军科. 基于虚拟仪器的IGBT电气参数自动测试系统[J]. 电源学报, 2014, 12(2): 27-34
作者姓名:姚丹  周雒维  方鑫  杜雄  孙鹏菊  吴军科
作者单位:重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室,重庆大学输配电装备及系统安全与新技术国家重点实验室
基金项目:国家自然科学基金重点项目(51137006)
摘    要:针对测量不同工作条件下IGBT模块电气参数时需要获取大量数据、反复改变工作点等问题,以容量为1200V/75A的绝缘栅双极晶体管为例,设计了一套基于虚拟仪器的IGBT电气参数自动测试系统。该系统通过硬件电路,结合LabVIEW和高速数字化仪,实现了IGBT的单脉冲开关测试。该系统不仅可以按一定规律自动测量不同电流、不同温度下的IGBT电气参数,还可以同时测量并保存多种参数,如饱和压降、门极电压、关断时间、集电极电流等。与传统的手动测试方法相比,该自动测试系统可以节约50%以上的测量时间,提高测试精度,且开发周期短。所得测试数据不仅可以用来研究温度对IGBT电气参数的影响,作为结温预测数学建模的数据来源,还可以用于研究IGBT电气参量和老化程度的关系,并将其作为状态评估依据,为IGBT的在线状态监测提供基础。

关 键 词:IGBT  饱和压降  LabVIEW  自动测试系统  状态监测
收稿时间:2013-12-08
修稿时间:2014-01-03

Automatic test system of IGBT electrical parameters based on virtual instrument
YAO Dan,ZHOU Luo-wei,FANG Xin,DU Xiong,SUN Peng-ju and WU Jun-ke. Automatic test system of IGBT electrical parameters based on virtual instrument[J]. Journal of Power Supply, 2014, 12(2): 27-34
Authors:YAO Dan  ZHOU Luo-wei  FANG Xin  DU Xiong  SUN Peng-ju  WU Jun-ke
Affiliation:State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University
Abstract:It needs to get a large amount of data and change the working point repeatedly, when measuring the IGBT module electrical parameters under different working conditions.So an automatic test system of IGBT electrical parameters based on virtual instrument was introduced with capacity of 1200 V/ 75A insulated gate bipolar transistor. It implements IGBT single-pulse switch test combining LabVIEW and high-speed digitizers. The system can not only measure regularly IGBT electrical parameters under different current and different temperature ,but also measure and save simultaneously a variety of parameters, such as the saturation voltage, off-time, the gate voltage. Compared with the traditional manual test method,It has a short development cycle , the high test precision and can save more than 50% of the measuring time. The test data obtained can be used as data sources of he junction temperature prediction mathematical modeling. The data can not only be used to study the influence of temperature on the IGBT electrical parameters but also be used to study the relationship between IGBT electrical parameters and the degree of aging. The measured data can be used as condition assessment basis for the IGBT and foundation for online condition monitoring.
Keywords:Insulated Gate Bipolar Transistors(IGBT)   saturation voltage   LabVIEW   automatic test system   Condition monitoring
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