Optical and Structural Properties of CdTe Grown by Molecular Beam Epitaxy at Low Temperature for Resonant-Cavity-Enhanced HgCdTe Detectors |
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Authors: | JGA Wehner RH Sewell CA Musca JM Dell L Faraone |
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Affiliation: | (1) School of Electrical, Electronic and Computer Engineering, The University of Western Australia, Crawley, WA, 6009, Australia |
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Abstract: | Investigation into resonant-cavity-enhanced (RCE) HgCdTe detectors has revealed a discrepancy in the refractive index of the
CdTe layers grown by molecular beam epitaxy (MBE) for the detectors, compared with the reported value for crystalline CdTe.
The refractive index of the CdTe grown for RCE detectors was measured using ellipsometry and matches that of CdTe with an
inclusion of approximately 10% voids. X-ray measurements confirm that the sample is crystalline and strained to match the
lattice spacing of the underlying Hg(1−x)Cd(x)Te, while electron diffraction patterns observed during growth indicate that the CdTe layers exhibit some three-dimensional
structure. Secondary ion mass spectroscopy results further indicate that there is enhanced interdiffusion at the interface
between Hg(1−x)Cd(x)Te and CdTe when the Hg(1−x)Cd(x)Te is grown on CdTe, suggesting that the defects are nucleated within the CdTe layers. |
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Keywords: | Detector HgCdTe Molecular beam epitaxy (MBE) |
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